Title: | Simulation of the Electrical Characteristics of Double Gate FinFET with the Variation of Channel Length |
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DOI: |
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Keywords: | FinFET, Nano HUB onlive, DG-MOSFET |
Abstract: |
In this research work, electrical characteristics of double gate FinFET
have been simulated by varying the length of the channel region. 40 nm,
50nm and 60nm channel length has been considered to simulate the drain
current VS front gate voltage characteristics for FinFET. For these
three different values of channel length, electric field profile along
the FinFET channel has also been studied in this research. Finally the
electrostatic potential along the channel has been simulated for varying
the channel length of the FinFET. After analyzing the simulations, it
has been proposed that higher drain current, wide variation of electric
field along the channel region as well as increased carrier mobility and
lower electrostatic potential along the channel can be achieved for
smaller value of the channel length of FinFET. The whole simulation
works have been performed by Nano HUB online simulation tool named
“DG-MOSFET” where the data of the simulation were processed and the
plots were generated. |
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